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Optical characterization of advanced nanomaterials with a high lateral resolution
Liška, Petr ; Münz, Filip (referee) ; Dvořák, Petr (advisor)
Advanced nanomaterials show a significant improvement in certain physical or functional properties compared to conventional materials. Such advanced materials are, for example, lead halide perovskites (LHP). It is a group of hybrid organic-inorganic materials with a direct bandgap exhibiting unique optical properties. The high quantum efficiency of photoluminescence makes nanocrystals or thin films of LHP suitable candidates for the production of light-emitting diodes, solar cells and LCD displays. Their inexpensive and simple fabrication together with their unique optical properties makes LHP one of the most developed materials of the last decade. This diploma thesis aims to study the optical properties of CsPbBr3 perovskite nanocrystals using high lateral resolution methods. CsPbBr3 perovskite nanocrystals show intense anti-Stokes photoluminescence. These nanocrystals can emit light with a lower wavelength than that of the light that causes their photoluminescence. The nanocrystals are prepared in two different ways: by evaporation or by crystallization of the precursor in a solution of dimethylformamide. The morphology, photoluminescence properties and chemical composition of individual nanocrystals are studied. Each nanocrystal is studied individually and its size, shape, photoluminescence properties and chemical compounds are determined, which leads to a deeper understanding of the anti-Stokes photoluminescence of perovskite nanocrystals.
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Design and Realization of the Second Generation Imaging Reflectometer and its Application in Optical Analysis of Thin Films
Vodák, Jiří ; Držík,, Milan (referee) ; Klapetek, Petr (referee) ; Ohlídal, Miloslav (advisor)
The work deals with a technique of imaging spectroscopic reflectometry developed at The Institute of Physical Engineering, Brno University of Technology. The technique is well suited for characterization of samples non–uniform along their surfaces. The technique is primarily used for optical characterization of thin films. First part of the work is focused on basic physical principles of the technique and on ways in which measurement data are obtained. It contains a basic description of evaluating methods and a basic concept of an imaging spectroscopic reflectometer with a description of main parts of such a device. The main part of the work is focused on a description of two devices which were built at The Institute of Physical Engineering together with a description of some of upgrades which were implemented to these devices during their development. A description of measurements done with the two devices is also included. Last part of the work is then focused on further development of the technique. Intention of possible evolution of the technique to imaging spectroscopic ellipsometry is proposed.
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Optical characterization of advanced nanomaterials with a high lateral resolution
Liška, Petr ; Münz, Filip (referee) ; Dvořák, Petr (advisor)
Advanced nanomaterials show a significant improvement in certain physical or functional properties compared to conventional materials. Such advanced materials are, for example, lead halide perovskites (LHP). It is a group of hybrid organic-inorganic materials with a direct bandgap exhibiting unique optical properties. The high quantum efficiency of photoluminescence makes nanocrystals or thin films of LHP suitable candidates for the production of light-emitting diodes, solar cells and LCD displays. Their inexpensive and simple fabrication together with their unique optical properties makes LHP one of the most developed materials of the last decade. This diploma thesis aims to study the optical properties of CsPbBr3 perovskite nanocrystals using high lateral resolution methods. CsPbBr3 perovskite nanocrystals show intense anti-Stokes photoluminescence. These nanocrystals can emit light with a lower wavelength than that of the light that causes their photoluminescence. The nanocrystals are prepared in two different ways: by evaporation or by crystallization of the precursor in a solution of dimethylformamide. The morphology, photoluminescence properties and chemical composition of individual nanocrystals are studied. Each nanocrystal is studied individually and its size, shape, photoluminescence properties and chemical compounds are determined, which leads to a deeper understanding of the anti-Stokes photoluminescence of perovskite nanocrystals.
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Design and Realization of the Second Generation Imaging Reflectometer and its Application in Optical Analysis of Thin Films
Vodák, Jiří ; Držík,, Milan (referee) ; Klapetek, Petr (referee) ; Ohlídal, Miloslav (advisor)
The work deals with a technique of imaging spectroscopic reflectometry developed at The Institute of Physical Engineering, Brno University of Technology. The technique is well suited for characterization of samples non–uniform along their surfaces. The technique is primarily used for optical characterization of thin films. First part of the work is focused on basic physical principles of the technique and on ways in which measurement data are obtained. It contains a basic description of evaluating methods and a basic concept of an imaging spectroscopic reflectometer with a description of main parts of such a device. The main part of the work is focused on a description of two devices which were built at The Institute of Physical Engineering together with a description of some of upgrades which were implemented to these devices during their development. A description of measurements done with the two devices is also included. Last part of the work is then focused on further development of the technique. Intention of possible evolution of the technique to imaging spectroscopic ellipsometry is proposed.
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